Leica DM R Serie Mode D'emploi page 64

After focusing you only need to press key (44.5)
until "OK!" is output in the display to store the
offset. Finally, switch off the microscope briefly
(42.14).
1.11 Storage of objective magnifications
As well as the offset values, the magnification of
each objective screwed in the nosepiece can be
stored during the calibration. First store the
offset values of at least two objectives.
By pressing the key (44.6) and simultaneously
turning the focusing wheel you can set the
magnification value of the objective currently in
the light path. It is automatically stored when
key (44.6) is released.
During calibration it is not possible to set or
delete thresholds. To conclude the calibration
the microscope must be temporarily switched
off.
The first time it is switched back on again the
upper threshold for the focal plane (objective
with highest magnification only) must be deleted
and reset. This also applies when the specimen
is replaced by a specimen of different thickness.
Survey observation without an objective*
In transmitted light, the focusable Bertrand lens
can also be used together with the survey
condenser (Fig. 45) as a survey objective with
ca. 1x magnification, making it possible to scan
objects with a diameter of about 25 mm (= width
of specimen slide). Not generally suitable for
photographic documentation. The DM RD HC
photomicro system can only be used from factor
1x, pronounced marginal fall-off (vignetting) is to
be expected.
64
Fit the survey condenser (cf Fig. 12, p. 23).
Remove objective or objective nosepiece.
Focus the Bertrand lens* (50.3), open the
aperture diaphragm
diaphragm (48.22) can now be used as aperture
diaphragm. For a more even illumination, a
diffusing screen can be used in the filter
magazine (42.15) or in the condenser holder B
(27.6). See also p. 80 and 102).
Incident light focusing graticule*
Focusing can be made easier by inserting
a graticule (23.11) into the diaphragm module
HC RF*, see page 29 – 30. After pulling out the
diaphragm module part way (= channel II) this
graticule is projected onto the specimen surface
and imaged together with it. This is particularly
useful for exact focusing of specimens lacking
in structures or contrast, e.g. for photo-
micrography or topological measurements.
Adjustment:
Attention! Only with Smith reflector! Set the
microscope exactly, particularly the eyepieces
and the aperture diaphragm. Exactly focus a flat,
contrasty focusing object (e.g. incident light
stage micrometer or mirror with scratches or
other structures). Pull out the HC RF diaphragm
module slightly = channel II, so that an image is
formed of the graticule.
+
+
)
Max. SFZ = 25, not at tube optics HCP (Pol 1x/1.6x/Bert-
rand lens)
= (48.21), the field