Denstply Sirona X-Smart IQ Protocole D'utilisation page 50

Input a.c. power PORT
Phenomenon
Electrical fast
transients /
a) l) o)
bursts
a) b) j) o)
Surges
Line-to-line
a) b) j) k) o)
Surges
Line-to-ground
Conducted
disturbances induced
c) d) o)
by RF fields
f) p) r)
Voltage dips
Voltage
f) i) o) r)
interruptions
a)
The test may be performed at any one power input voltage within the ME EQUIPMENT or ME
SYSTEM RATED voltage range. If the ME EQUIPMENT or ME SYSTEM is tested at one power
input voltage, it is not necessary to re-test at additional voltages.
b)
All ME EQUIPMENT and ME SYSTEM cables are attached during the test.
c)
Calibration for current injection clamps shall be performed in a 150 Ω system.
50/52
Basic EMC standard
or test method
IEC 61000-4-4
IEC 61000-4-5
IEC 61000-4-5
IEC 61000-4-6
IEC 61000-4-11
IEC 61000-4-11
END-IFU-X-SMART-IQ-V16-WEB-EUR-Multilingual-2021-01
Immunity test levels
Professional
healthcare facility
environment
± 2 kV
100 kHz repetition
frequency
± 0.5 kV, ± 1 kV
± 0.5 kV, ± 1 kV,
± 2 kV
m)
3 V
0.15 MHz – 80 MHz
m)
6 V in ISM bands
between 0.15 MHz
n)
and 80 MHz
e)
80% AM at 1 kHz
0% U ;
T
g)
0.5 cycle
at 0°, 45°, 90°, 135°,
180°, 225°, 270° and
q)
315°
0% U ;
T
1 cycle
and 70% U ;
T
h)
25/30 cycles
Single phase: at 0°
0% U ;
T
h)
250/300 cycle
Test results
Pass
Pass
Pass
10 Vrms
Pass
Pass
Pass