Megger LCB2000/2 Guide De L'utilisateur page 37

Specifications
∆n Test
1 ⁄
I
2
Contact Voltage
Displayed range: 0V to 90V
Measurement range: 5V to 90V
Intrinsic error: +5%/+15%±0.5V
Loop resistance (measured at
IDn Resolution
10 0,5Ω to 9kΩ
30 170Ω to 3kΩ
100 50Ω to 900Ω
300 17Ω to 300Ω
500 10Ω to 180Ω
1000 5Ω to 90Ω
2 second No Trip test at
The test current flows for 2 seconds. A tripped RCD will
result in a display of <1999ms
Intrinsic Test Current accuracy:
Trip Tests
I∆n Trip Test
This test will perform a short automatic
followed by a 30 second delay (Selective type only) then
execute a Trip test.
36
∆n)
1 ⁄ I
2
∆n (optional)
1 ⁄
I
2
-8% to -2%
∆n test,
1 ⁄ I
2
General purpose TestI∆n test for up to 300ms
I∆n test for up to 2000ms
Selective Test
Timed Trip Tests
Trip time
displayed Range 0,1ms to test time limit
Intrinsic Trip time accuracy
Intrinsic Test Current accuracy
Ramp Test (Trip current measurement)
This test will perform an automatic
a 30 second delay (Selective type RCD only) and then
execute an incremental ramp test.
Intrinsic Ramp Test Current accuracy ±3%
IDn Ramp Range
10 5-15mA
30 15-50mA
100 50-150mA
300 150-300mA
500 250-500mA
1000 500-1020mA
±1% ±1ms
+2% to +8%
∆n test followed by
⁄
1 I
2
Increment
1mA
1mA
2mA
6mA
10mA
52mA