Specification - X-Rite i1 Pro Manuel De L'utilisateur

Specification

Spectral
engine:
Spectral range:
Physical sampling interval:
Optical resolution:
Spectral reporting:
Measurement frequency in scanning
mode:
Optics:
Measurement geometry:
Measurement aperture:
Illumination spot size:
Light source:
Reflectance
measurement:
Measurement condition:
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i1 ® technology (holographic diffraction grating with 128 pixel diode array)
380 - 730 nm
3.5 nm
10 nm
380 nm ... 730 nm in 10 nm steps
200 measurements per second
45º/0º ring illumination optics, ISO 13655:2009
4.5 mm (0.18") diameter
(effective measurement aperture during scanning is depending on the
patch size and measurement speed)
3.5 mm (0.14")
Gas filled Tungsten (illuminant type A)
spectral reflectance [dimensionless]
UV excluded Filter - ISO 13655:2009 measurement condition M2
:
Calibration:
Measurement background:
Maximal media thickness:
Minimal patch size in scanning mode:
Inter-Instrument-Agreement:
Short-term repeatability:
Emission
measurement:
Measurement range:
Short-term repeatability:
Ambient light
measurement:
Interface:
Manual on external ceramic white reference
white, ISO 13655:2009; for measurements on backup board
3 mm (0.12") on backup board
10 x 10 mm (0.39" x 0.39") (Width x Height)
0.4 ∆E94* average, 1.0 ∆E94* max.
(deviation from X-Rite manufacturing standard at a temperature of 23ºC
(73.4ºF) on 12 BCRA tiles (D50, 2º))
0.1 ∆E94* on white (D50,2°, mean of 10 measurements every 3 s on
white)
2 2
spectral radiance [mW/nm/m /sr], luminance [cd/m ]
2
0.2 - 1200 cd/m on a typical LCD-Monitor
2
x,y ±0.002 typ. (5000 K, 80 cd/m )
2
spectral irradiance [mW/nm/m ], illuminance [lux]
cosine corrected diffusor light measurement head
USB 1.1
EN
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