Chauvin Arnoux C.A 6545 Notice De Fonctionnement page 59

Parameters
to be modifi ed
Test duration, in "Programmed-
time test" mode
n d n d
1 a n d 2 t i m e f o r P I
calculation
Time between samples in
"Programmed-time test"
mode
Limit for 500 V - 2 T 
Limit for 1000 V - 4 T 
Limit for 2500 V - 10 T 
Limit for 5000 V - 10 T 
Limit for Var-50/5000 V
Time
Date (Europe version)
Version: USA, Europe
Erase memory
Selective deletion of memory MEM then
Baud
Buzzer
Auto cut-off
Confi guration by default
Dielectric test voltage
Disturbance Limit voltage
Automatic range
Test voltage locking
The values shown in this table, in the "main display" and "small display" columns, are default values
programmed at the factory. In case of mistaken modifi cation, it is possible to restore them: see § 4.7.3.
Control key
main
tESt
second period
R-DAR-PI-DD
(10:00)
R(t)
500 k 
ALARM
1 M 
nd
ALARM (2 press)
2.5 M 
ALARM (3 rd press)
5 M 
ALARM (4 th press)
5 M 
th
ALARM (5 press)
V-TIME
nd
V-TIME (2 press) 17.03
V-TIME (3 rd press) USA/Euro
MEM then
cLr
MEM (2 s)
and
FrEE / OCC
and MEM (2 s)
PRINT 9600
On
On
nd
(2 press)
rd
(3 press)
DFLt
then START
SEt
(4 th press)
0.03 U
th
(5 press)
Auto
th
(6 press)
oFF
(7 th press)
59
Display
small symbols
30: 00 min. sec
first period
min: sec
(01:00)
00: 30 min: sec
30 k-2 T  and ><
500 V ALARM <
ALARM < 100 k-4 T  and ><
1000 V
ALARM < 300 k-10 T  and ><
2500 V
ALARM < 300 k-10 T  and ><
5000 V
10 k-10 T  and ><
Set ALARM <
12:55
2000
ALL MEM
OBJ:TEST
MEM
Number
bAUd
SEt
100 V V
dISt V 0.03 / 0.10 / 0.20
rAnG
1000 V
values
01:00 - 59:59
00:30 - 59:59
00:05 - 30:00
hour (00-23)
minute (00-59)
dd.mm.yyyy
USA/Euro
00 - 99
300 - 9600
or "parallel"
On / OFF
On / OFF
40 - 5100 V
Auto/1/2/3
On / OFF
40 - 5100 V