Technical Data - BEHA UNITEST TELARIS Fi/RCD Mode D'emploi

13.0 Technical Data

13.1 Tables wih test currents
Table 1 Test Currents Function VC/RE, tRCD/VC, Auto (mA)
IΔN UB/RE-
Measurement:
Prestest
10 4
30 12
100 40
300 120
500 200
400
1000
Table 2 Ramp Currents Function I<, tRCD/VC (mA)
IΔN
10 4-14
30 12-42
100 40-140
300 120-420
500 200-700
1000 400-1400
Table 3 RCD Trip Times for standard RCB´s
Fi/RCD-Type Current Type
IΔN
10mA/
30mA/
100mA/
300mA/
500mA/
1000mA
x0.5 x1
5 3,5 5 10 14
15 10,5 15 30 42
50 35 50 100 141 100
150 105 150 300 424 300
250 175 250 500 707 500
500 1000
1,4-20 1-14
4,2 - 59 3-42
14-198 10-140
42-594 30-420
71-990
Current Type Test Current
IΔN IΔN
x0.5 0.5x
x1 1x
x2 2x
x5 5x
Ramp 0.4x- 1.4x
x0.5 0.35x
x1 1.4x
x2 2.8x
x5 7x
Ramp 0.1x- 1.4x
x0.5 0.5x
x1 1x
x2 2x
x5 5x
Ramp 0.1x- 1.4x
x2
~
10 20 28 20
30 60 84 60
200 283 200
600 849 600
1000
2000
prescribed Test Time
Trip Time
-
2000ms, IΔN≥100mA: 500ms
<300ms 500ms
<150ms 150ms
<40ms 40ms
<300ms 300ms
-
2000ms, IΔN≥100mA: 500ms
<300ms 500ms
<150ms 150ms
<40ms 40ms
<300ms 300ms
-
2000ms, IΔN≥100mA: 500ms
<300ms 500ms
<150ms 150ms
<40ms 40ms
<300ms 300ms
Technical Data
x5
50 70 50
150 212 150
500 707 500
1500
Standard Fi/RCD
DIN VDE Analyzer
IEC61008-1
√
IEC61008-1 √
IEC61008-1
√
IEC61008-1
√
IEC61008-1
√
IEC61008-1
√
IEC61008-1
√
IEC61008-1 √
IEC61008-1
√
IEC61008-1
√
√
0664- Part 100
√
0664- Part 100
√
0664- Part 100
√
0664- Part 100
0664- Part 100 √
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