Technical Data - Mettler Toledo Refracto 30PX Mode D'emploi

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Technical data

Measurement principle
Light source
Sampling
Working temperature
Storage temperature
Temperature accuracy
Range of measurement nD
(refractive index)
Range of measurement nD
(refractive index)
Accuracy nD (refractive index)
Resolution
Range of measurement Brix
Accuracy
Resolution
Display
Materials
Housing
Measuring cell (Refracto 30PX)
Measuring cell (Refracto 30GS)
Materials in contact with sample
Materials in contact with sample
Weight
Measuring time per sample
Data memory
Interface
Battery operation
Battery lifetime
Range of measurements and accuracy of remaining units: see next page.
Subject to technical changes.
METTLER TOLEDO Refracto 30PX/GS
Measurement of the refractive index by
determination of the critical angle of total
reflection.
LED, λ = 589.3 nm
By means of a pipette (bench-top mode)
or by dipping the measuring cell into the
sample (dip-in mode)
10...40 °C
–20...70 °C
±0.2 °C
1.32...1.50 (Refracto 30PX)
1.32...1.65 (Refracto 30GS)
±0.0005
0.0001
0...85 %
±0.2 %
0.1 %
Backlit LC-Display
PBT (Polyester)
Stainless steel SUS 316, glass
hard gold-plated brass, sapphire
PBT, stainless steel, glass (Refracto 30PX)
PBT, gold, sapphire (Refracto 30GS)
approx. 200 g
3...180 seconds
1100 results
Infrared for printer and PC
2 x 1.5 V batteries (LR03); type AAA
approx. 60 hours (at 1 measurement per
minute and backlighting off)
Technical data
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