Prospective Short Circuit Current Test (Psc/Ik); Rcd Testing; Rcd Types Tested - Beha-Amprobe Telaris Série Guide D'utilisation

Range Resolution
20 Ω 0.01 Ω
200 Ω 0.1 Ω
2000 Ω 1 Ω
Note:
[1] Valid for resistance of neutral circuit <20 Ω and up to a system phase angle of 30 °.
[2] Valid for mains voltage >200 V.
Prospective Short Circuit Current Test (PSC/I
Computation
Range
Resolution and Units
Accuracy

RCD Testing

RCD Types Tested

RCD Type[6]
[1] [2]
AC G
[3]
AC S
[4]
A G
A S
[5]
B G
A S
Note:
[1] AC – Responds to ac
[2] G – General, no delay
[3] S – Time delay
[4] A – Responds to pulsed signal
[5] B – Responds to smooth dc
[6] RCD test inhibited for V >265 ac
RCD tests permitted only if the selected current, multiplied by earthing resistance, is <50V.
[1]
Accuracy
No Trip mode: ±(4 % + 6 digits)
Hi Current mode: ±(3 % + 4 digits)
±(5 %)
[2]
±6 %
Prospective Short Circuit Current (PSC/IK) determined by
dividing measured mains voltage by measured loop (L-PE)
resistance or line (L-N) resistance, respectively.
0 to 10 kA
Resolution
I <1000 A
K
I >1000 A
K
Determined by accuracy of loop resistance and mains
voltage measurements.
Telaris ProInstall-100
√
√
√
√
27
)
K
Units
1 A
0.1 kA
Telaris ProInstall-200
√
√
√
√
√
√